Abstract
The measurement of transparent objects has always been regarded as one of the difficult problems in 3D reconstruction technology. For transparent objects conforming to the birefringence model, we propose a method for measuring the parameters of transparent objects based on multi-wavelength incident light. This paper analyzes the transparent objects where light enters the birefringence model. Because the transparent objects refract light of different wavelengths differently, when the lights with different wavelengths emitted from the same point and same direction passes through the transparent objects, the position and direction of light with different wavelength will come out differently. The position and direction of these outgoing rays are related to the refractive index and surface topography of the transparent objects. By obtaining the equations of these outgoing rays, we can derive the equations of the refractive index and surface topography of the transparent objects. In this paper, the incident light obtained by computer simulation is used as the initial data, and the simulated annealing algorithm is used to verify the model. The final results show that within the range of random error values given by the computer, the surface shape, curvature, thickness and refractive index of transparent objects with small error values can be obtained. At the same time, this paper introduces the Ceres Solver C++ nonlinear optimization library into the simulated annealing algorithm, which improves the speed and accuracy of the algorithm and greatly enhances the robustness of the algorithm.
Published Version
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