Reliable extraction of x-ray refraction and dark-field signals with a large field of view, multi-modal scanning system at spectral energies up to 150 kVp

Abstract

Abstract Multi-modal x-ray scanning allows the simultaneous acquisition of attenuation, refraction and ultra-small angle scattering or dark field images. While many examples of multi-modal x-ray scanning exist in the literature, extension to high x-ray energy, necessary to investigate dense and high-Z materials, still poses challenges. We present the investigation of attenuation, refraction and dark field images taken at 90, 120 and 150 kVp, using a scanning, large field of view multi-modal imaging system. Increases in tube voltage reduce both contrast and signal to noise but still produce satisfactory results suitable for quantitative analysis. On top of benchmarking against phantoms made of known materials, we illustrate this by scanning a 9 V PP3 battery; a highly absorbing sample which causes photon starvation at lower energies.