Abstract

Space mapping (SM) is one of the most efficient simulation-driven design technologies used in microwave engineering to date. It includes so-called output SM that ensures exact matching between the EM-evaluated microwave structure under consideration (fine model) and its surrogate at the current design. The standard, single-point output SM exploits the fine model data at a single design and is not able to align the models' sensitivity. Here, a multipoint response correction is proposed that generalizes the concept of output SM. By using a design-variable-dependent correction term and exploiting all available fine model information, the proposed technique provides exact match between the surrogate and the fine model at several designs. This retains the benefits of output SM but also enhances sensitivity matching between the two models, which results in improved performance of the SM optimization process. The efficiency of the propose approach is demonstrated using several microwave design problems. © 2011 Wiley Periodicals, Inc. Int J RF and Microwave CAE, 2011. © 2011 Wiley Periodicals, Inc.

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