Reliability Test Plan Based on Logistic-Exponential Distribution and Its Application

Abstract

In this article, a reliability test plan is developed for Logistic-exponential distribution (LoED) under time truncated life test scheme. The distribution has been chosen because it can used to model lifetime of several reliability phenomenon and it performs better than many well known existing distributions. With the discussions of statistical properties of the aforesaid model, the reliability test plan has been established under the assumption of median quality characteristics when minimum confidence level P* is given. To quench the objective of the paper i.e; to serve as a guiding aid to the emerging practitioners, minimum sample sizes have been obtained by using binomial approximation and Poisson approximation for the proposed plan. Further, operating characteristic (OC) values for the various choices of quality level are placed. Also, minimum ratio of true median life to specified life has been presented for specified producer’s risk. Important findings of the proposed reliability test plan are given for considered value of k=0.75,1,2. To demonstrate the appropriateness of suggested reliability test plan is achieved using four real life situation.