Abstract
Early stages of existence of electronic devices are considered: design stage and stage of early failures. At the design stage, works on evaluation of reliability of various variants of structure of electronic devices are carried out. At performance of the given works, help data by manufacturers of components are used. The important question is definition of failure rate of components during the moments of time further from time of publication of help data. The method of forecasting of reliability of components is offered. The method considers data by the manufacturer on change of failure rate of components during the moments of time after publication of help data. The stage of early failures of electronic devices is considered. Two models of dependence of failure rate on time for the given stage are analyzed. Methods of estimation of parameters of considered models and method of estimation of conformity of models with statistical data on failures are offered. Models of reliability of electronic devices are nonlinear, the numerical method of finding the parameters of models is therefore considered. The method provides carrying out of computing experiment. Bibl. 9 (in English; abstracts in English and Lithuanian). http://dx.doi.org/10.5755/j01.eee.112.6.445
Highlights
Introduction rate of components during the moments of time further from time of publication of help data
Evaluation works related to reliability of various variants of structure of electronic devices [3]
Let's analyze a case when the manufacturer specifies certain values K ti, i 1, l for the moments works on revealing early failures in a rational way is possible having estimated reliability of electronic devices for the given stage [3, 5, 6]
Summary
Introduction rate of components during the moments of time further from time of publication of help data. Let's analyze a case when the manufacturer specifies certain values K ti , i 1, l for the moments works on revealing early failures in a rational way is possible having estimated reliability of electronic devices for the given stage [3, 5, 6]. It is easy to show that based on the method of the least squares, values of coefficient A in (2) can be determined from expression reliability of components applied at a design stage of electronic devices is analyzed. With the information on failures Ni of devices during the moments of time ti i 1, n of carrying out of technological running–in, it is possible to receive statistical evaluations (at t ti ) of average value ˆ i and a dispersion Di of failure rate. Let's consider area of possible values 0 with limits 0min and
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