Abstract
This is an application-oriented article on I DDQ to guide test engineers to a pragmatic method of implementing I DDQ . This article focuses on different aspects of I DDQ testing; quality, reliability, and test implementation. A description of I DDQ is presented, with different practical methods of implementing it, with empirical reliability data of I DDQ failures, and with empirical burn-in data identifying potential yield benefits. Employing I DDQ testing on digital CMOS technology, the user obtains a product with greater reliability. The data presented within this article, along with increasing customer focus on zero defects, clearly support I DDQ implementation.
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