Abstract
Parallel and standby configurations can be applied to semiconductor switches to improve the reliability of power electronic converters in mission-critical applications. In this paper, the reliability models of both configurations are developed based on the Markov process. The mean time to failure (MTTF) of each configuration is derived in terms of the underlying parameters. It is demonstrated that there is a boundary condition in which both configurations have the same MTTF. This boundary condition is expressed in terms of the junction temperature of the semiconductor switch in the steady state. The temperature range in which the parallel configuration is more reliable is formulated for different types of power semiconductor switches including MOSFETs, bipolar junction transistors, SCRs, triacs, regular diodes, and Schottky diodes. Case studies are presented to determine the more reliable configuration for a laboratory-scale buck converter.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
