Abstract
The reliability analysis for the system with degradation and random shocks is an important issue in the field of reliability engineering. In this paper, we use Wiener process to fit the performance degradation process, and regard both the degradation rate and the mean of the magnitude of shock load as random variables which follow the truncated normal distribution. With the Markov Chain Monte Carlo(MCMC), we provide a new method to estimate the parameters of the reliability function of the system. At the end of the paper, we take the degradation and shock data of the MOSFET as an example to show the effectiveness of the method presented in the paper.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: Communications in Statistics - Simulation and Computation
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.