Abstract
We present a different approach to obtain the distribution of relaxation times from dielectric spectroscopy (DS) and TSDC recorded current density. The method consists in decomposing the whole relaxation peak into a sum of elementary processes and it is based on the simulated annealing Monte Carlo procedure together with the direct signal analysis. It gives the contribution to the polarization of a set of N relaxation times which cover a chosen interval. The analysis of the DS curves in the frequency or time domain will lead to G(ln/spl tau/), while the TSDC analysis gives the N relaxation times whose superposition best reproduce the experimental profile, each of them characterized by a reorientation energy and by a preexponential factor of the Arrhenius or Vogel-Tammann-Fulcher, VTF, temperature dependent relaxation time.
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