Relationships between critical current and stress IN NbTi

Abstract

The effects of various types of stress on the critical current of a multifilamentary NbTi superconductor are reported. Degradation of critical current due to axial tension applied at 4 K, transverse compression applied at 4 K, and hairpin bending strain applied at room temperature has been measured. The degradation from axial tension is much greater than from transverse compression in many practical cases because the soft copper matrix limits the build-up of transverse compression. The degradation from typical levels of transverse compression is only about 4% at 8 T, for example. For axial tension, on the other hand, higher stresses can occur that will degrade the critical current by 24%, for example, at 7 T and 2.7% strain. Both the axial-tensile and the transverse-compressive stress effects are about 98% reversible; thus the degradation will be seen only when the conductor is under operational stress. The results indicate that a primary origin of the critical current degradation in NbTi is a stress-induced reversible decrease in the upper critical field.