Abstract
Degradation due to electrostatic discharge (ESD) is an important reliability issue for GaInAsP/InP buried-heterostructure laser diodes (LDs). Although this degradation mechanism has been previously discussed, the relationship between ESD tolerance and aging has not been investigated. For forward-biased ESD, the degradation mechanism is similar to that of catastrophic optical damage. Therefore, ESD tolerance can be assumed to decrease during an aging test. However, the relationship between reverse-biased ESD tolerance and aging is less clear. We investigated this relationship, focusing particularly on reverse bias, and observed a decrease in ESD tolerance owing to aging. Specifically, the ESD tolerances decreased by approximately 30 and 70% for facet-coated and uncoated GaInAsP/InP Fabry–Perot LDs, respectively, as a result of aging longer than 3000 h. We determined that facet coating is effective in suppressing the reduction in ESD tolerance caused by aging.
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