Abstract
Although the crystal structure in aramid fibers and the relationship between the size and orientation of crystallites and the performance of a material have been explored in detail, the effect of microvoids in an aramid fiber on its performance is still not clear. However, it is known that the mechanical properties depend strongly on the fiber morphology. In the present research, two-dimensional small-angle X-ray scattering is applied to characterize the microvoids in aramid fibers. Pauw's two-dimensional full pattern fitting method and scattering model have been enhanced by introducing orientation parameters, such as zenith angle distribution and azimuthal angle distribution, and instrumental parameters like point spread function and beam profile function. A series of aramid fibers with different strengths were studied using the new two-dimensional full pattern fitting method to extract the microvoid parameters from the scattering patterns. The results show that the microvoids in the aramid fiber affect the fiber strength directly. The greater the number of spherical microvoids and the larger the ellipsoidal microvoids, the weaker the aramid fiber.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.