Abstract
We present electro-optical characterization (by deep level transient spectroscopy, deep level optical spectroscopy and photo-induced current transient spectroscopy) on vanadium doped CdTe and CdZnTe crystals prepared by the vertical Bridgman method for photorefractive applications. Two main electron traps at 0.95 and 0.78 eV were detected and characterized. These levels are strongly involved in the photorefractive effect of CdTe doped with V, and led to distinguish two classes of crystals.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
