Abstract
Textured YBa/sub 2/Cu/sub 3/O/sub x/ plates show a significant spread in the critical current density up to 12.000 A/cm/sup 2/ measured by direct transport current at 77 K. This spread is related to the crystalline texture of the material. Optical polarization microscopy is used for initial examination of crystal alignment and texture. We use synchrotron radiation at 100 keV to perform x-ray diffraction measurements to obtain quantitative information about the texture. The crystallographic [110]-direction is found to be preferentially along the slab and the c-axis is parallel to the largest face. DC-magnetization is used to measure the magnetization critical current density of pieces cut around each x-ray measurement point. The results from x-ray diffraction, optical microscopy and magnetization critical current density are compared to the transport critical current density. The magnetization critical current is found to decrease exponentially with the in-plane texture.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call