Abstract
Measurements of the relation between flux jump fields and quench currents Iq were carried out for a Nb-50at.%Ti wire without Cu cladding. A coil simulation method was used applying inphase magnetic fields and currents up to 0.4 T and 65 A, respectively. At 4.2 K two regions of quench behaviour can be distinguished. Whereas in the low current region Iq is constant, it depends almost only on the total surface field in the high current region indicating that the quenches in this case are induced directly by flux jumps. At lower temperatures flux jump and quench fields are not directly related.
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Schedule a callMore From: Proceedings of the Ninth International Cryogenic Engineering Conference Kobe, Japan 11–14 May 1982
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