Abstract

The sorghum [Sorghum bicolor (L.) Moench] germplasm lines Tx2935 through Tx2944 (Reg. No. GP‐674, PI 650871 to Reg. No. GP‐683, PI 650880) were developed and released by Texas Agricultural Experiment Station—now Texas AgriLife Research—College Station, TX in 2004. These germplasm lines were selected and developed to provide the sorghum industry with elite seed‐parent sorghum germplasm of diverse pedigree with good general combining ability and unique combinations of grain color, plant color, agronomic traits, and resistance to head smut [caused by Sporosorium relianum) (Kuhn) Langdon & Fullerton], rust [caused by Puccinia purpurea (Cooke)], and anthracnose [caused by Colletotrichum graminicola (Ces.) G.W. Wilson]. These lines were developed using the pedigree breeding approach with selection environments in Texas and Puerto Rico. Each of these germplasms was then evaluated in testcross combinations (with common seed parent testers) in multiple environments in Texas. Each of these germplasms showed good general combining ability and adaption for Texas sorghum production environments. This germplasm is suitable for use as a pollinator parent for the production of grain sorghum hybrids or as a parental source for the development of improved pollinator parent lines

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