Abstract

The sorghum [Sorghum bicolor (L.) Moench] germplasm lines A/BTx2929 through A/BTx2934 (Reg. No. GP‐662, PI 650859 to Reg. No. GP‐673, PI 650870) were developed and released by the Texas Agricultural Experiment Station—now Texas AgriLife Research—College Station, TX, in 2004. These germplasm lines were selected and developed to provide the sorghum industry with elite seed‐parent sorghum germplasm of diverse pedigree with good general combining ability and unique combinations of grain color, plant color, agronomic traits, and resistance to head smut [caused by Sporosorium relianum) (Kuhn) Langdon & Fullerton], rust [caused by Puccinia purpurea (Cooke)], and anthracnose [caused by Colletotrichum graminicola (Ces.) G.W. Wilson]. These lines were developed using the pedigree breeding approach, and selections were carried out in Texas and Puerto Rico. Male‐sterile versions of these seed parents were produced using backcross breeding approaches and ATx623 as the source of male‐sterile cytoplasm. Backcrossing was conducted at either the Texas or Puerto Rico locations. Each of these germplasms was then evaluated in testcross combinations (with common pollinator parents) in multiple environments in Texas. Each of these germplasms showed good general combining ability and adaption for Texas sorghum production environments. This germplasm is suitable for use as a seed parent for the production of grain or forage sorghum hybrids or as parental sources for the development of improved seed parent lines.

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