Abstract
Optical properties of Si are important and widely studied. However, temperature dependence of the refractive index for visible light at low temperatures has not been measured. In this study, we measured the complex refractive index of Si at 400 nm between 10 and 300 K by picosecond ultrasound spectroscopy. The measured refractive index at room temperature agrees well with reported values, confirming the accuracy of our measurement, and we found that the refractive index at 10 K is smaller than reported values.
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