Analyze the relationship between wavelength, refractive index and extinction coefficient separately

Abstract

We can know that the change of wavelength is always increasing, but the change of refractive index increases and decreases. We first analyze the relationship between wavelength, refractive index and extinction coefficient separately, and then conduct multiple regression modeling for wavelength, refractive index, wavelength, and extinction coefficient. According to this situation, we establish a multiple regression model to obtain the implicit function relationship between wavelength, refractive index, and extinction coefficient. By substituting the data, we get that the refractive index of a 50 nm thick tungsten in 0.3-5 μ m is 144.354. We model the relationship between the emission spectra of multilayer structures and material properties. Based on the composite structure emission spectrum model based on the transfer matrix method (TMM), we substitute the data of silica and tungsten, and we can clearly see the emission spectra of the composite structure formed by tungsten (50 nm) and silicon dioxide (50 nm) in the range of 0.3-5 microns.