Abstract
Resonant magnetic reflectivity is a powerful technique for the study of magnetic heterostructures enabling the chemical and magnetic profile to be determined with element specificity and spatial resolution of better than 1 nm. A model for describing interface roughness in thin layers is presented which can be implemented within standard reflectivity simulation protocols. By fitting the resonant scattering terms it is shown how the magnetic profile can be extracted and correlated with the chemical profile quickly. The model is applied to itinerant systems with an induced magnetic polarization which is both temperature and field dependent.
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