Abstract
AbstractSeveral experimental results on common single‐layer samples have been obtained in the microwave domain using the reflection ellipsometry technique and two different data analysis procedures. They lead to estimations of complex permittivity as a function of the angle of incidence, frequency, and thickness. The influence of measurement uncertainties is discussed. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 36: 243–248, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10733
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