Abstract
Precise spatial characterization of vectorial beams is crucial for many advanced optical experiments, but challenging when wavefront and polarization features are involved together. Here we propose a reference-free method aimed at extracting the map of the complex-amplitude components of any coherent beam at an optical-microscopy resolution. Our method exploits recent advances in ptychographic imaging approaches. We emphasize its versatility by reconstructing successfully various experimental vectorial beams including polarization and phase vortices, the exit field of a multicore fiber and a speckle pattern.
Highlights
Recently-developed vectorial beams involve complicated spatial distributions of intensity, phase and state of polarization (SoP)
Since phase and polarization measurements are required, we propose in this work to exploit recent progress in phase-retrieval imaging by means of vectorial ptychography [20]
We have proposed an approach aiming at measuring arbitrary vectorial light beams, based on recent progress in vectorial ptychography
Summary
Recently-developed vectorial beams involve complicated spatial distributions of intensity, phase and state of polarization (SoP) When produced intentionally, those beams are expected to provide additional degrees of freedom to light; emblematic examples are vortex beams that are tailored in a twisted fashion in polarization [1] and/or in phase, in order to carry an orbital angular momentum [2]. Those beams are expected to provide additional degrees of freedom to light; emblematic examples are vortex beams that are tailored in a twisted fashion in polarization [1] and/or in phase, in order to carry an orbital angular momentum [2] These specific features are expected to offer progress towards denser information encoding in telecommunications [3], novel conditions of light-matter interaction, optical manipulation [4], materials processing [5], microscopy [6,7] and non-linear optics [2]. Measuring such beams allowed quantifying the so-called transmission matrix of the medium, a key parameter for further controlling light propagation in such media [11]
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