Abstract
A biaxially textured buffer layer of LaZrO (LZO) was continuously grown on Ni-5-at%W (NiW) tapes using a reel-to-reel DC reactive sputtering technique. X-ray diffraction measurements revealed that the LZO layer deposited at water vapor partial pressures of 2.5×10−2 Pa and the temperature of 800 °C are biaxially textured with the misorientation as low as 4.7°. AFM measurements show that the layer’s surfaces are homogeneous and flat with the RMS value less than 5 nm. YBa2Cu3O7−δ (YBCO) superconducting films grown on the single LZO buffer layer exhibited the critical temperature (T c ) of 89 K with a narrow transition width less than 2 K. For comparison, another Ce2Y2O7 (CYO) layer grown using DC reactive sputtering was added on the top of the LZO layer. The architecture YBCO/CYO/LZO/NiW exhibited better texture and higher T c such as 90 K with ΔT c of 1.5 K, demonstrating the availability of a novel simplified buffer layer stack of CYO/LZO for superconducting coated conductors.
Published Version
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