Reduced Kernel Random Forest Technique for Fault Detection and Classification in Grid-Tied PV Systems

Abstract

The random forest (RF) classifier, which is a combination of tree predictors, is one of the most powerful classification algorithms that has been recently applied for fault detection and diagnosis (FDD) of industrial processes. However, RF is still suffering from some limitations such as the noncorrelation between variables. These limitations are due to the direct use of variables measured at nodes and therefore the only use of static information from the process data. Thus, this article proposes two enhanced RF classifiers, namely the Euclidean distance based reduced kernel RF (RK-RF <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">ED</sub> ) and K-means clustering based reduced kernel RF (RK-RF <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Kmeans</sub> ), for FDD. Based on the kernel principal component analysis, the proposed classifiers consist of two main stages: feature extraction and selection, and fault classification. In the first stage, the number of observations in the training data set is reduced using two methods: the first method consists of using the Euclidean distance as dissimilarity metric so that only one measurement is kept in case of redundancy between samples. The second method aims at reducing the amount of the training data based on the K-means clustering technique. Once the characteristics of the process are extracted, the most sensitive features are selected. During the second phase, the selected features are fed to an RF classifier. An emulated grid-connected PV system is used to validate the performance of the proposed RK-RF <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">ED</sub> and RK-RF <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Kmeans</sub> classifiers. The presented results confirm the high classification accuracy of the developed techniques with low computation time.