Reduced Graphene Oxide Via Green Route Exposure of Gamma (γ) Ray for Surface Morphological Investigation

Abstract

I³-ray radiation was used to reduce graphene oxide thin films to partially reduced graphene oxide films at ambient conditions. Micro-Raman spectroscopy showed that irradiation of GO with I³-rays did not change the structure of graphene. The I³-rays are only active on the oxygen functional groups bonds because they are short and highly energized wavelengths. I³-rays penetrate the C-C lattice isotropically hence sustaining the graphene layer structure. This results in transparent and intact r-GO thin films with no structural defects. The defects on the structure would result to the opaqueness of the C-C lattice hence compromising the transparency of the material. The Scanning electron microscopy, Transmission Scanning electron, Fourier transform infrared and Raman spectrometry are presented.