Recovery of small orientation gradients in a recrystallized grain observed in 3D during ex-situ annealing

Abstract

We report the observation of a small orientation gradient (~0.5° over a few micrometers) in a recrystallized grain formed at the sample surface in pure Al and the elimination of this orientation gradient during subsequential ex-situ annealing. The observation is in 3D and done using synchrotron white-beam differential-aperture X-ray microscopy with high angular resolution of 0.01°. The elimination of the orientation gradient during subsequent annealing are analyzed and discussed.