Abstract
The transmission line techniques are generalized to measure the permittivity function of one-dimensional inhomogeneous dielectrics. A rectangular waveguide is used and the dielectric slab under test is placed at the input flange of it. Then the measured scattering parameters or the short-circuited reflection coefficient are used to extract the permittivity function of dielectric. To solve the problem an optimization-based procedure is used. The usefulness of the proposed method is verified using a comprehensive example.
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