Abstract
The three-dimensional (3D) faceting morphology of ceria nanoparticles is analysed usingtransmission electron microscopy (TEM)-based computed tomography on the nanometrescale. A novel tomography mode of electron energy loss spectroscopic imaging usinga single energy window for inelastically scattered electrons is introduced andfound to be reliable and fast for freestanding nanoparticles. To compare the newtomographic method with other methods, we provide the first comprehensiveapplication of three complementary TEM-based imaging techniques, including brightfield TEM and annular dark field specific TEM (STEM). Traditional bright-fieldTEM tomography is found to be applicable, in spite of obvious artefacts, forcrystalline particles of constant composition. However, the safest interpretationis achieved by a combined recording of bright field and spectroscopic images.
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