Abstract
Quaternary AlGaAsSb alloys have exhibited low excess noise characteristics as gain regions in avalanche photodiodes. In this work, optical spectroscopy techniques are used to demonstrate the recombination dynamics in molecular beam epitaxy grown Al0.85Ga0.15As0.56Sb0.44 with temperature variation. Photoluminescence (PL) measurements at 8–50 K show that the bandgap varies from 1.547 to 1.527 eV. The radiative recombination processes in the alloy were found to be dictated by the complexities of antimony (Sb) incorporation during the growth. Time-resolved PL (TRPL) measurements show a change in initial carrier lifetimes of ∼3.5 µs at 8 K to ∼1 µs at 30 K. The knowledge of carrier dynamics from optical characterization methods such as PL and TRPL can be employed to contribute to shorter feedback loops for improvement of alloy fabrication in addition to enhancing growth processes.
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