Abstract

For the purpose of imaging element- and shell-specific magnetic distributions under high magnetic fields, a scanning soft X-ray microscope has been developed at beamline BL25SU, SPring-8, Japan. The scanning X-ray microscope utilizes total electron yield detection of absorbed circularly polarized soft X-rays in order to observe magnetic domains through the X-ray magnetic circular dichroism effect. Crucially, this system is equipped with an 8 T superconducting magnet. The performance and features of the present system are demonstrated by magnetic domain observations of the fractured surface of a Nd14.0Fe79.7Cu0.1B6.2 sintered magnet.

Highlights

  • One of the most useful ways to assess how the reversed magnetic domains are generated and evolve during magnetization reversal processes is by directly observing the magnetic domain structure

  • X-ray magnetic circular dichroism (XMCD) imaging under high magnetic fields requires the use of a superconducting magnet (SCM)

  • Kerr microscopy (Takezawa et al, 2014; Khlopkov et al, 2004), magnetic force microscopy (MFM) (Yamaoka et al, 2014), scanning transmission X-ray microscopy (STXM) with XMCD (Ono et al, 2011; Ohtori et al, 2014), and photoemission electron microscopy (PEEM) with XMCD (Yamamoto et al, 2008; Yamaguchi et al, 2011) have been applied as methods for observing magnetic domains in Nd–Fe–B magnets, but these observations have been limited to polished surfaces or transmittable thin films, in which the coercivity significantly decreases compared with the bulk value (Hirosawa et al, 1987; Fukagawa & Hirosawa, 2008)

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Summary

Introduction

One of the most useful ways to assess how the reversed magnetic domains are generated and evolve during magnetization reversal processes is by directly observing the magnetic domain structure. Kerr microscopy (Takezawa et al, 2014; Khlopkov et al, 2004), magnetic force microscopy (MFM) (Yamaoka et al, 2014), scanning transmission X-ray microscopy (STXM) with XMCD (Ono et al, 2011; Ohtori et al, 2014), and photoemission electron microscopy (PEEM) with XMCD (Yamamoto et al, 2008; Yamaguchi et al, 2011) have been applied as methods for observing magnetic domains in Nd–Fe–B magnets, but these observations have been limited to polished surfaces or transmittable thin films, in which the coercivity significantly decreases compared with the bulk value (Hirosawa et al, 1987; Fukagawa & Hirosawa, 2008). XMCD at applied magnetic fields of 0 T (thermally demagnetized state) and Æ 8 T (fully saturated states)

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