Real-time X-ray diffraction using synchrotron radiation: System characterization and applications

Abstract

Time resolved X-ray diffraction can provide information about temporal aspects of structural changes as they occur in a sample. The advent of powerful synchrotron radiation sources and the development of various fast detection systems make it possible to explore this developing area. The dynamics of wide and small angle X-ray diffraction have been recorded in real-time with a two-dimensional electro-optical detector. Performance characteristics of the detection system [3-stage image intensifier with ZnS(Ag) fluorescent screen] and read-out devices (video camera, cassette recorder/player, and monitor) are presented. Quantitative intensity information was obtained by interfacing the video recorder with a Grinnell digital image processing system. We have demonstrated the applicability of this real-time diffraction method for investigating the dynamics and mechanism of structural changes induced in a variety of materials. Samples were selected to (1) cover a range of material types representative of the various applied and basic sciences, (2) provide examples of materials that scatter well enough to investigate their wide or small angle diffraction patterns in live time, and (3) illustrate the type of perturbations that can be applied and the range of processes that can be examined.