Abstract
Real time resolved scanning Kerr microscopy has been used to study the switching dynamics of 50 μm diameter epitaxial Fe(100) disks. The measurements were performed using a sinusoidal sweeping field with a sweep rate of dH/dt=10 kOe/s. By performing repetitive one-shot measurements, we have mapped the statistical fluctuations and the probability distribution of characteristic switching parameters as the switching instant t0, and the switching speed, V. We observe a substantial difference in the parameters estimated from the average of several measurements compared to the parameters extracted from the probability distributions. This illustrates the potential risks of using averaging techniques in dynamic measurements, in addition to the loss of the statistical information. The disks were found to display an inhomogeneous switching, which is believed to be caused by defect damped motion of the domain walls and a inhomogeneous distribution of defects.
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