Abstract
The main aim of this paper is to fabricate and characterize silver oxide thin films and to investigate the effect of processing parameters on the microstructure of deposited films. Radio frequency (RF) magnetron sputtering was used under oxygen-argon mixed gas atmosphere for fabrication. Oxide phase evolution and stability were investigated by X-ray diffraction (XRD) of as-deposited and post deposition annealed films. In all cases, the hexagonal phase was initially observed which then got transformed to the cubic phase upon annealing films. The hexagonal–cubic "transition" temperature decreases initially upon increase of oxygen content, which is corroborated by optical spectra. The evolution of optical absorption edge was monitored by a spectrophotometer. A bandgap energy of 3.5 eV was deduced for Ag 2 O at 300 K. Atomic force microscopy (AFM) has revealed the influence of deposition conditions on the surface morphology of the films.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
