Abstract
Helium ion-induced re-emission of hydrogen implanted in graphite with 5 keV H 2 + ion beam at room temperature has been investigated in the energy range from 60 to 200 keV, by means of a high energy elastic recoil detection method with 16 MeV O 5+ ion beam. The hydrogen concentrations in graphite rapidly decrease with increasing the He + ion fluence and reach a constant value of H/C≅0.2. The re-emission rates of hydrogen from graphite increase with decreasing incident energy of the He + ion. The He + ion-induced detrapping cross-sections have been evaluated by analyzing the experimental data with mass balance equations including elementary processes such as detrapping, trapping and local molecular re-combination between an activated hydrogen atom and a trapped one. The elastic displacement collisions with energetic carbon recoils produced by He + ion bombardments are dominant for the detrapping of hydrogen in the range of the incident energies.
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