Abstract
Isothermal re-emission of hydrogen from graphite implanted with 5 keV H2 + ion beam up to saturation (3×1018/cm2) at room temperature has been studied by means of the elastic recoil detection (ERD) technique at temperatures of 450, 500, 550 and 600°C. It is found that the concentration of retained hydrogen decreases rapidly in the beginning and then decreases very gradually as the annealing time increases. The re-emission profiles have been analyzed taking into account local molecular recombination between activated hydrogen atoms and that between an activated hydrogen atom and a trapped one together with retrapping of the activated hydrogen atom. It is shown that the re-emission of hydrogen by isothermal annealing occurs mainly due to the former type of local molecular recombination and that the activation energy of the thermally activated detrapping rate constant is 0.50±0.04eV. Moreover, it is shown that an analytical expression for the re-emission profile reproduces reasonably well the observed thermal desorption spectra.
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