Abstract
Extra low carbon steel samples were yttrium implanted using an ion implantation method. Composition and structural studies were carried out before and after yttrium implantations by several analytical and structural techniques (Rutherford backscattering spectrometry, reflection high energy electron diffraction, scanning electron microscopy, X-ray diffraction, and glancing angle X-ray diffraction) to characterize the yttrium implantation effect on extra low carbon steel. The aim of this article is to show the contributions of Rutherford backscattering spectrometry (RBS) and glancing angle X-ray diffraction (GAXRD) to the determination of yttrium depth profiles in the samples. The results obtained by these techniques are compared to those of the other analyses performed in this work to show the existing correlation between composition and structural studies. Our results allow a better understanding of the effect of yttrium implantation in extra low carbon steel before studying their corrosion resistance at high temperature.
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