Abstract
Pure electrolytic iron samples were yttrium implanted using ion implantation method. Composition and structure studies were carried out before and after yttrium implantations by several analytical and structural techniques such as Rutherford backscattering spectrometry (RBS), secondary ion mass spectrometry (SIMS), reflection high energy electron diffraction (RHEED), electron spectroscopy for chemical analysis (ESCA) and X-ray diffraction (XRD) to characterize the yttrium implantation effect on the samples. The aim of this paper is to show the contribution of Rutherford backscattering spectrometry to the determination of yttrium depth profiles in pure electrolytic iron. The results obtained by RBS will be compared to those of the other analyses performed in this work to show the existing correlation between composition and structural studies. Our results allow a better understanding of the effect of yttrium implantation in pure iron before studying the specimen corrosion resistance at high temperature.
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