Ray Tracing Simulation of X-ray Microdiffraction Beamline on the Inverse Compton Source

Abstract

This paper deals with the simulation of output beam parameters of the inverse Compton X-ray Source (ICS). The simulation takes into account the main parameters of the laser and electron beams, such as their pulse shapes, polarization properties as well as the angular and energy dispersion of the electrons. The layout of the presented ICS and X-ray optical beamline is dedicated to X-ray micro-diffraction studies. To maintain the axial symmetry of output X-ray beams at different photon energies, the beamline monochromator is based on a single crystal installed in the Borrmann transparency condition.