Abstract
High switching fluctuation induced by the random formation and rupture of conductive filaments (CFs) is a critical issue for the development of organic-inorganic perovskite-based resistive switching (RS) memory devices. In this study, a rapid microwave-annealing method is developed to reduce grain boundaries (GBs) of CH3NH3PbI3 (MAPbI3) film and improve the switching reliability of the Au/MAPbI3/FTO device. The crystal grain size of MAPbI3 is increased and the corresponding GBs number is reduced with microwave irradiation time ranging from 40 to 120 s. In the optimized case, the dispersion of the RS parameters of the Au/MAPbI3/FTO cell is greatly reduced. Specifically, the fluctuations of the high/low resistance states and SET/RESET voltages dropped from 70.4%/69.5% and 40.5%/40.3% to 20.1%/26.7% and 16.0%/11.9%, respectively. The device can be operated with reduced compliance current. These results demonstrate that reducing the number of GBs is a feasible strategy to reduce the randomness of the CFs, and thus achieve more stable RS performance in MAPbI3-based memory devices.
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