Abstract
Abstract Ce-doping NiFe2O4 spinel ferrite thin films were prepared on Pt / Ti / SiO2 / Si substrates using a chemical solution deposition method. It has been observed that Ce-doping induced enhancement of unipolar resistive switching properties, such as uniform switching voltages, enlarged ON / OFF ratio, and long retention in Pt / NiFe2O4 / Pt memory devices. The dominant conduction mechanisms in the thin film devices were Ohmic conduction at low resistance state and lower voltage region of high resistance state, while Schottky emission dominated at higher voltage region in high resistance state. The physical mechanism of resistive switching is related to the formation and rupture of conducting filament. The improved stability of the switching parameters for the devices can be attributed to Ce-doping minimizing random formation and rupture of conductive filament. This study indicates that doping rare earth ions in ferrite thin films would be an effective approach for obtaining stable resistance switching memory devices.
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