Abstract
We studied fast growth of graphene on copper using ethanol precursor, by low pressure chemical vapor deposition. We have used three different types of copper foils to investigate the effects of copper purity and crystallographic orientation on the nucleation density of graphene for a fixed growth time of 10s. We have used X-ray diffraction (XRD) and Electron back-scattered diffraction (EBSD) to investigate the facets present in the copper foils. In this rapid growth process, the nucleation density of graphene islands is found to be independent of facets in all the three Cu foils but we observed a variation in nucleation density and island size on different copper foils keeping all the growth parameters same.
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