Abstract

In small punch testing, with approximate preknowledge of the sample deformation, profile measurement need only be made at selected locations in depth. To date, profilometry through full-field low-coherence interferometry has not been applied to small punch testing—conventional methods typically measure the maximum displacement as the sample is deformed, ignoring useful shape and profile information. A modification of full-field low-coherence interferometry is presented, where a digital stepper motor is combined with piezoelectric transducer scanning to achieve random depth access three-dimensional micrometer profile measurement. Offering a rapid, inexpensive, and functional machine vision system, the measurement technique is applied to a small punch test.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.