Abstract
Raman backscattering spectra from fractured and etched surfaces of PbTeSnTe alloys have been studied and compared with X-ray photoelectron spectroscopy (XPS) analysis of the surfaces. For samples freshly broken in air or suitably etched electrolytically, the spectra are identified with very thin (−monolayer) films of oxide, chemically as TeO2. For samples etched in HNO3 and HCl and for as-grown epi-films the spectra are identified with thin films of elemental tellurium. On n-type material, the surface oxide spectrum is found to change with time after fracture going from an initial rapidly formed TeO2 spectrum, similar to that of p-type material, to a spectrum identified with a mixture of Pb and Te oxides.
Published Version
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