Abstract
Raman scattering measurements are used to characterize the amorphous and crystalline components of microcrystalline Si films. A model is described which addresses the properties of Raman scattering from composites of materials of different optical absorption. The analysis shows that the observed spectra is dependent on both the percentage of the components and on the domain size of the more highly absorbing domains. Samples of microcrystalline silicon prepared by excimer laser exposure of hydrogenated a-Si and by magnetron sputtering were measured, and the results were analyzed in terms of the model. The experimental results reflect the length scales of the domains and vibrational excitations.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
