Abstract
High quality AlN single crystals grown by physical vapour transport and by sublimation of AlN powder were investigated by Raman, photoluminescence (PL) and absorption spectroscopy. Absorption edges of the AlN single crystals varying from 4.1 eV to 5.9 eV as determined by transmission measurements. Near band edge absorption, PL and glow discharge mass spectroscopy identified impurities such as oxygen, silicon, carbon, and boron that contribute to the absorption and emission bands below the bandgap. The absorption coefficients were derived from UV (6 eV) to FIR (60 meV) spectral range. The exact crystal orientation of the samples, and their low carrier density were confirmed by Raman spectroscopy. (© 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
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