Abstract
Fe in—diffusion was performed by depositing a Fe film on X-cut LN substrates by sputtering and subsequent annealing in a controlled atmosphere. The photorefractive properties of the Fe:LN film were studied by confocal Micro–Raman spectroscopy. The presence of unexpected lines in the Raman spectra of the samples was detected and attributed to the activation by the photoinduced space charge field which is also the cause of the photorefractive effect. The results in Fe-doped samples are compared to those recorded in nominally pure congruent crystals.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
