Abstract
Measurements of the temperature dependence of the amplitude of the rf size effect (RFSE) in Cd have been performed in order to determine the electronic mean free path (EMFP) for certain groups of charge carriers. Two kinds of effects were observed. One is identified as coming from the “lens” part of the Fermi surface. The temperature dependence of the EMFP is determined and compared to previous data. The other occurs at low fields. Although there is some question as to its origin, the EMFP vs. temperature is determined, based on the assumption that it is a size effect (rather than a single surface impedance effect), probably from the cigars of the Fermi surface. It is found that the RFSE is useful for finding the magnitude of the EMFP but that it may be difficult to determine the analytical form of its temperature dependence in comparison to proposed models.
Published Version
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