Abstract
In this study, we examine the reliability of erasable programmable read only memory (EPROM) and electrically erasable programmable read only memory (EEPROM) components under the influence of gamma radiation. This problem has significance in military industry and space technology. Total dose results are presented for the JL 27C512D EPROM and 28C64C EEPROM components. There is evidence that EPROM components have better radioactive reliability than EEPROM components. Also, the changes to the EPROM are reversible, and after erasing and reprogramming all EPROM components are functional. On the other hand, changes to the EEPROM are irreversible, and under the influence of gamma radiation, all EEPROM components became permanently nonfunctional. The obtained results are analyzed and explained via the interaction of gamma radiation with oxide layers.
Published Version
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