Abstract
Radio frequency (RF) induced power deposition near straight insulated leads excited by different incident electrical field profiles was investigated. 3-D electromagnetic (EM) simulations were used to obtain implant models as well as RF-induced power depositions calculated as the integral of power loss density. For the investigated setups up to 400% discrepancy between the implant model predictions and EM simulation values was observed.
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Schedule a callMore From: Annual International Conference of the IEEE Engineering in Medicine and Biology Society. IEEE Engineering in Medicine and Biology Society. Annual International Conference
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