Abstract
Photoluminescent (PL) properties of pure C60 thin solid films were investigated in the emission range of 1.2–2.4eV over a wide temperature range, under excitation with 36eV photon from the undulator beamline of UVSOR. Degradation of PL intensity of the 1.67eV band was discovered under long-time irradiation in ultra-high vacuum condition and its dose dependence was examined at various ambient conditions. Temperature dependence of PL intensity from 10 K to 300 K exhibited an anomaly at the vicinity of the structural phase transition Tc ∼ 250K. Time-resolved decay measurements exhibited the decay components of 1.2±0.1ns and of about 400μs. From the influence of oxygen on degradation of PL intensity, we suppose that the triplet state is highly populated and non-radiative decay process mainly occur.
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